MSV
3.-7.10. 2016

Brief characteristics of the exhibit

LiteScope is a modular accessories of scanning electron microscopes (SEM). It enable 3D characterization of the surface or measurement of the magnetic and electrical properties by atomic force microscopy (AFM). LiteScope is utilized for the sample analyses in the nano and micro technologies on the sample area 100x100 µm with the resolution below 0,4 nm. Completely new measurement method CPEM (Correlative Probe and Electron Microscopy) offer direct correlation of the images obtained by two complementary techniques SEM and AFM. Microscope LiteScope is applied in the research and quality control on the area of the material science, semiconductor industry or in solar cell research. Low price, user friendly approach and new measurement technique CPEM predetermine LiteScope as a new standard accessories of the electron microscopes.

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